- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatus; applications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/22 - Probes, their manufacture or their related instrumentation, e.g. holders
Patent holdings for IPC class G01Q 60/22
Total number of patents in this class: 161
10-year publication summary
17
|
12
|
8
|
16
|
11
|
5
|
10
|
15
|
3
|
0
|
2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Hitachi, Ltd. | 16452 |
11 |
Bruker Nano, Inc. | 334 |
9 |
Centre National de La Recherche Scientifique | 9632 |
7 |
Samsung Electronics Co., Ltd. | 131630 |
4 |
The Regents of the University of California | 18943 |
4 |
Baylor University | 313 |
4 |
Universidade Federal de Minas Gerais - Ufmg | 193 |
4 |
Xi'an Jiaotong University | 579 |
4 |
Commissariat à l'énergie atomique et aux energies alternatives | 10525 |
3 |
attocube Systems AG | 38 |
3 |
Danmarks Tekniske Universitet | 902 |
3 |
Technische Universiteit Eindhoven | 316 |
3 |
LIG Nanowise Limited | 9 |
3 |
Hitachi High-Tech Corporation | 4424 |
3 |
Hitachi High-Tech Science Corporation | 326 |
2 |
The Board of Trustees of the Leland Stanford Junior University | 6054 |
2 |
Industry-Academic Cooperation Foundation, Yonsei University | 2329 |
2 |
Lehigh University | 160 |
2 |
Neaspec GmbH | 4 |
2 |
Regents of the University of Minnesota | 2620 |
2 |
Other owners | 84 |